Semiconductor Electical test services

PTS has proven experience in the screening and qualification to MIL-PRF’s

  • 38535

  • 38534

  • 19500

DLA suitable for MIL-STD test methods

  • 883

  • 750

  • 202

Reliability screening and qualification in accordance with

  • NASA/GSFC EEE-INST-002

  • MIL-PRF’s-23 32535 (Capacitors)

  • MIL-PRF-55342 (Resistors)

  • MIL-PRF-27 (Inductors & Transformers)

Semiconductor Physical analysis

Destructive Physical Analysis capabilities

  • MIL-STD-1580 

  • ​SEM / EDS Analysis

  • Prohibited Material Analysis 

  • Construction Analysis

  • Real Time X-Ray

  • Visual Inspection

  • Bond Pull/ Die Shear

  • Device Decapsulation

  • Lead Integrity

  • PIND

  • C-SAM

  • Counterfeit Detection

  •  Fine / Gross Leak 

Environmental Stress Services

Product qualification and testing

  • MIL-STD-810

  • MIL-DTL-22992

  • DO-160

  • NEMA TS-2 / TS-4

​ Capabilities include:

  • Mechanical Shock

  • Vibration

  • Temperature Cycling

  • Temperature / Humidity

  • Altitude

  • Salt Atmosphere

  • Constant Acceleration

  • Water Ingress 

  • Water  Immersion

  • HALT / HASS

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